Stellarnet has unveiled its Thin Film Companion software for in situ and in-line measurements of film structures.
The Thin Film Companion software offers real-time spectral capture and instrument control for reflectance and/or transmittance.
It includes a large library of materials data and new material can be added by measuring the corresponding sample or importing data from file.
TFC software provides many options to analyse simple and most complex film- stacks: graded layers, periodic structures, very thick films, films on thin substrates, multi-sample measurements, and so on.
Simulation and error-estimator tools allow users to better understand data and the expected precision.
Thin Film Companion supports parameterised materials for example, Cauchy, Sellmeir, EMA (effective medium approximation), Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz and many more approximations.
These approximations represent optical dispersion of materials in desired spectral range using few coefficients that can be adjusted.
USB connectivity and user-friendly software make daily complex measurements quick and simple.
