All Electron microscopy systems
Scientists map "most important" protein
Added: 21 Jul 2014
Understanding the secondary structure of the anaphase-promoting complex (APC/C) could lead to the d…
Leeds extends microscopy capability
Hitachi High Technologies | Added: 16 Jun 2014
The University of Leeds Electron Microscopy and Spectrocopy Centre has extended its electron micros…
Ultrafast electron microscope
FEI | Added: 14 Nov 2013
FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…
High-throughput microscopy sample preparation
FEI | Added: 13 Nov 2013
ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…
FEI to showcase Helios NanoLab 660
FEI | Added: 4 Jul 2013
FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…
Hitachi launches SU8200 series
Hitachi High Technologies | Added: 27 Jun 2013
Hitachi High-Technologies has released the innovative SU8200 series of cold field emitter SEMs worl…
Hitachi launches table-top microscope
Hitachi High Technologies | Added: 31 May 2013
The 3rd generation TM3030 microscope is designed to provide better resolution when imaging at 5 kV.
Scientists discover structure of protein essential for quality control
Added: 15 Jan 2013
The Scripps Research Institute (TSRI) has pushed the boundaries of electron microscopy to determine…
Microscopy of Arabidopsis thaliana root tips cells
Leica Microsytems | Added: 19 Dec 2012
This technical note describes the preparation method for electron microscopy of high pressure subst…
Diamond-like coating improves electron microscope images
Added: 18 Dec 2012
Researchers have found that coating materials with diamond-like crystals greatly improves images of…
Scanning Electron Microscopy applied to porous materials
Jeol USA | Added: 31 Oct 2012
This document provides an appraisal of high resolution Scanning Electron Microscopy applied to poro…
Verios SEM delivers high resolution measurement
FEI | Added: 31 Jul 2012
SEM allows measurement of sensitive materials in semiconductor and materials applications.
NeoScope microscope delivers improved magnification
Jeol USA | Added: 12 Jul 2012
Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.
Ultra-high resolution analytical field emission SEM
Jeol USA | Added: 5 Jun 2012
High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample
Bruker's next generation EDS detectors
Bruker Nano Analytics | Added: 26 Apr 2012
Bruker has introduced XFlash 6, the next generation of silicon drift detectors (SDD) for energy dis…
Agilent's 'first-of-a-kind' ICP-MS device
Agilent Technologies | Added: 24 Jan 2012
Agilent says its 8800 triple quadrupole ICP-MS (ICP-QQQ) is the first such instrument.
Asylum AFMs perform advanced measurements
Asylum Research | Added: 25 Oct 2011
Asylum Research provides its MFP-3D and Cypher atomic force microscopes (AFMs) with capabilities th…
FEI offers mudlogging analysis for oil industry
FEI | Added: 20 Oct 2011
The Qemscan Wellsite analysis system from FEI is suitable for mudlogging services for the oils and …
Elliot offers microscope for forensic scientists
Elliot Scientific | Added: 5 Sep 2011
Elliot Scientific is now offering the Elixir microscope from Craic Technologies for the accurate an…
HT7700 allows analysis of light element materials
Hitachi High Technologies | Added: 18 Aug 2011
Hitachi has announced that it will be exhibiting its new-concept HT7700 digital TEM for the first t…
