FEI
5350 NE Dawson Creek Drive
Hillsboro
Oregon
97124
Latest Articles
Electronics failure analysis applications from FEI
FEI | Added: 20 Nov 2014
FEI has released two application packages for its third-generation Helios NanoLab DualBeam systems,…
Metals lab to open at microscopy centre
FEI | Added: 9 Jun 2014
FEI and The University of Manchester have announced their collaboration on the Metals Lab at The Un…
Ultrafast electron microscope
FEI | Added: 14 Nov 2013
FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…
High-throughput microscopy sample preparation
FEI | Added: 13 Nov 2013
ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…
FEI introduces three TEM systems
FEI | Added: 12 Aug 2013
FEI has launched three systems that tailor the power of transmission electron microscopy to specifi…
FEI to showcase Helios NanoLab 660
FEI | Added: 4 Jul 2013
FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…
FEI launches Helios 1200AT Dual Beam system
FEI | Added: 13 Jun 2013
The NanoLab 1200AT system claims to deliver results 3 times faster than lab analysis of cleaved waf…
FEI launches Tecnai Arctica for structural analysis
FEI | Added: 12 Feb 2013
Tecnai Arctica makes advanced structural analysis available to a broader range of facilities and bu…
A correlative microscopy solution for cell biologists
FEI | Added: 27 Nov 2012
New methods in correlative microscopy are helping combine data from different imaging techniques.
FEI launches Helios NanoLab 450 F1 DualBeam
FEI | Added: 13 Nov 2012
The DualBeam from FEI claims to deliver faster, more accurate answers for new processes and materia…
