Latest Product Update
Jeol launches EDS for rapid elemental mapping
Jeol USA | Added: 15 Jul 2011
Jeol has developed Centurio, an energy dispersive spectrometer (EDS) for ultra-fast and ultra-sensi…
Phenom-World extends usability of G2 desktop SEM
Phenom-World | Added: 7 Jul 2011
Phenom-World has introduced a temperature-controlled sample holder and improved Fibermetric applica…
Forum will focus on atomic force microscopy
Asylum Research | Added: 28 Jun 2011
ETH Zurich, Atomic Force FandE and Asylum Research have announced that the third Euro AFM Forum - a…
PFIB system removes material 20 times faster
FEI | Added: 13 Jun 2011
FEI has released the Vion plasma focused ion-beam (PFIB) system that is said to remove material mor…
Large specimen sputter coaters for SEM preparation
Electron Microscopy Sciences | Added: 9 Jun 2011
Electron Microscopy Sciences has introduced the EMS 300 series of large specimen sputter coaters fo…
Mex turns SEM into a 3D surface metrology device
Electron Microscopy Sciences | Added: 9 Jun 2011
Electron Microscopy Sciences has announced that the Mex scanning electron microscope 3D measurement…
Website offers complete Dumont tweezer selection
Electron Microscopy Sciences | Added: 9 Jun 2011
Electron Microscopy Sciences has created a website offering a complete selection of Dumont tweezers…
EMS launches catalogue of products for histology
Electron Microscopy Sciences | Added: 9 Jun 2011
Electron Microscopy Sciences has launched the 2011 EMS print catalogue, as well as a new catalogue …
Hitachi launches field emission microscope
Hitachi High Technologies | Added: 6 Jun 2011
Hitachi High-Technologies has introduced a scanning electron microscope (SEM) for applications such…
Navigation system designed for SEM and EPMA users
Jeol USA | Added: 1 Jun 2011
Jeol is offering a 'point-and-shoot' navigation system that makes finding precise locations on a sa…
Bruker presents EBSD detector at Pittcon 2011
Bruker Nano Analytics | Added: 17 May 2011
Bruker launched its E FlashHR system, a high-resolution, high-sensitivity detector that enables ele…
Jeol TEM rapidly resumes operation after flashing
Jeol USA | Added: 11 May 2011
Jeol's JEM-ARM200F atomic resolution transmission electron microscope (TEM) is claimed to set a new…
Chemistem enables atomic-level spectroscopy
FEI | Added: 6 May 2011
FEI is extending its Chemistem technology to enable atomic-level energy dispersive X-ray (EDX) spec…
Cypher AFM achieves atomic-scale point defects
Asylum Research | Added: 3 May 2011
Asylum Research has announced that its Cypher AFM is routinely achieving resolution of atomic-scale…
Specimen-cleaning chamber for electron microscopy
XEI Scientific | Added: 26 Apr 2011
XEI Scientific has launched its new Softclean specimen-cleaning chamber to be used with the Evactro…
Nanowizard 3 AFM system for imaging applications
JPK Instruments | Added: 24 Mar 2011
JPK Instruments has launched the Nanowizard 3 Nanoscience AFM system, which is designed to provide …
SPM technique probes electrochemical reactivity
Asylum Research | Added: 16 Mar 2011
Asylum Research has announced the Electrochemical Strain Microscopy (ESM) imaging technique for its…
Electrochemistry cell for use with AFM microscope
Asylum Research | Added: 11 Mar 2011
Asylum Research has produced the Electrochemistry (EC) Cell, for use with its MFP-3D Atomic Force M…
Asylum announces Cypher AFM tour dates
Asylum Research | Added: 4 Mar 2011
Asylum Research, a scanning probe and atomic force microscopy (SPM/AFM) specialist, has announced t…
Desktop SEM provides 45,000x magnification
Phenom-World | Added: 2 Mar 2011
Phenom-World has launched the second generation of desktop scanning electron microscopes (SEMs), th…
