Jeol JEM-ARM200F TEM has atomic resolution

19 Feb 2010 by Jeol USA

(a-b) Bright field (BF) and high angle annular dark field (HAADF) STEM images of Si [110] taken at 200 kV on the UT-SA JEOL JEM-ARM200F. The HAADF image shows information transfer to 0.078 nm, while the BF image resolves spatial information < 0.1 nm. (c-d) Bright field (BF) and high angle annular dark field (HAADF) STEM images of Si [110] taken at 120 kV on the UT-SA JEOL JEM-ARM200F. The HAADF image and BF image both show information transfer to < 0.1 nm.
 
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