The PC-controlled H-9500 transmission electron microscope (TEM) from Hitachi High-Technologies is now available in Europe
Designed for rapid sample throughput, the H-9500 forms part of Hitachi's family of sample preparation and inspection tools, with specimen holders, which are completely interchangeable with the FB-2100 focused ion beam instrument and the HD-2300 Stem.
Samples prepared in the FB-2100 can be transferred directly into the H-9500.
The H-9500 is a high performance TEM which uses a single crystal LaB6 electron source and offers 0.102nm crystal lattice resolution and 0.18nm point-to-point resolution.
With fast run-up times, the instrument is ready for use in three minutes and subsequent specimen exchanges take just one minute, giving high sample throughput.
The H-9500 is equipped with a high resolution (1K x 1K pixel) CCD camera with fast or slow scan functions to record the high quality images.
An integral, searchable image database allows images to be stored complete with full details of operating conditions.
The addition of an energy dispersive X-ray system makes the H-9500 a powerful materials analysis tool.
Sample navigation is simplified with a specimen position trace facility.
This provides tracking and display of the specimen stage movement.
Coordinates may be stored at any position along the movement path, allowing the operator to immediately see which areas of the specimen have been examined and which have not.
Point to point and calliper measurement functions are also included
