Pacific Nanotechnology (PNI) reports that the first dedicated SPM system for the characterisation of nanoparticles is being accepted by researchers the world over
It is based on the new PNI Nano-R2 platform with enhanced hardware and software to deliver a productive, easy-to-use system that is truly innovative.
The Nano-RP is a complete particle characterisation system.
It utilises an atomic force microscope designed for capturing three-dimensional images of nanoparticles.
This state-of-the-art laboratory SPM may be used in both EZMode and X'pertMode through the user friendly SPM Cockpit software platform.
One leading research group using the Nano-Rp is based at the University of California, Irvine.
Group leader Martha Mecartney says: "PNI has identified a critical need in nanoscale technology and measurements in the real world and responded with a unique approach to easily and reliably measure and characterize nanoparticles.
"It not only developed innovative hardware and software but also designer substrates for optimal deposition and imaging of specific types of nanoparticle".
The Nano-RP system includes everything required for nanoparticle characteriaation.
The AFM allows the user to visualise 2D and 3D topography as well as to measure the nanoparticle's average size, size distribution and 2D concentration.
Preparation of the nanoparticles for study is simplified through provision of extremely flat activated substrates.
The samples are first fixed (anchored) and then placed on the microscope stage for scanning.
Analysis is performed using the NanoRule+ particle characterization software package.
The software enables the user to present data in a wide variety of convenient formats including exportable tables and graphs.
