Anton Paar has published an Application Report detailing the use of its new AFM, Tosca 400, to characterise polymer blends in terms of high-resolution morphology and phase images.
The surface properties of polymeric materials are central to their behaviour in formulation and manufacturing processes, as well as in their target applications. The atomic force microscope (AFM) is a powerful tool for characterising polymer surfaces at the nanoscale. It provides not only surface morphology, but also phase contrast between different components in polymer blends.
