Pacific Nanotechnology (PNI), having introduced the tabletop Nano-R AFM systems, now brings an advanced platform for research applications delivering dual scanner technology, the Nano-DST
The Nano-DST provides a radical new approach to the world of atomic force microscopy, AFM.
Rather than having a single scanner restricted by scan area and resolution limitations, the Nano-DST incorporates two scanners.
The large area scanners come in three options to study areas up to 100, 200 or 400 microns in X and Y.
Using flexure design and light lever detection, these scanners exhibit particularly low bow and coupling.
The second scanner is a 5micron tube design which is embedded in a dedicated sample puck.
This may be used alone or when combined with the flexure scanner, the user is able to scan a large area to locate a specific feature and then zoom in to make a high resolution image.
This is of benefit to those with the most challenging AFM imaging applications The Nano-DST uses the latest controller technology.
It is the first SPM controller to use two X, Y, Z scanning control cards backed with 24 bit electronics using industry standard National Instrument cards.
These advanced components enable fast scanning where collection of a 300 line image is made in one second.
PNI co-founder and CTO Paul West, was excited about the new zoom capability to collect high resolution images: "PNI has provided a research tool that combines ease of use with top quality scanning performance.
"With the cost of ownership playing an important part in the buying of new equipment, the nano-DST delivers in all departments".
The Nano-DST system has all the basic scanning capabilities expected by users of AFM today.
And PNI also offer a myriad of advanced scanning modes in an environment where users may also use the platform to develop their own techniques.
