Fritsch particle sizing instruments offer state-of-the-art laser technology for an unique price performance ratio, for each particular area of application and utilisation
The patented Fritsch measuring method by laser diffraction inside the convergent laser beam gives a simple continuous adjustment of the measuring area as well as up to now unknown number of measuring channels.
With the Compact, MicroTec, MicroTec XT and NanoTec systems, and the possibility to combine corresponding components, you can configure a measurement system that is precisely adapted to your needs, with reliability and efficiency guaranteed by Fritsch as a specialist in particle measurement technology.
With the Analysette 22 Compact for example, Fritsch provides a solution for sample materials in the particle size range from 0.3 to 300um which require a particularly easy-to-use bench model instrument with an extremely attractive price-performance ratio.
With its flagship NanoTec for example, Fritsch offers the option of shape analysis as well as a measurement range from 2000um down to 0.01um - the entry into the nano range.
