Carl Zeiss supplements the topography module of its AxioVision microscopy software with new functions which improve microscopic roughness measurements and height measurements using stereomicroscopes
As a result, surfaces can be measured with much more detail in materials microscopy and displayed in such a way that the user seems to be able to touch and feel them.
This expansion of functionality makes it possible for the first time to specify the cut-off wavelength for Gaussian filtering of the calculated height chart.
Furthermore, the roughness values from unfiltered primary profiles, highpass-filtered roughness profiles and lowpass-filtered waviness profiles can now also be determined, and the user can draw any required number of profile lines in the evaluated image in any direction.
In addition to roughness measurements, height measurements have also been optimized.
For example, height images of stereo image pairs of an object can now be calculated on the stereomicroscope.
This requires the dual phototube S for connection of two microscope cameras.
Thanks to these new functions, roughness and waviness parameters are now easier to determine and several profile lines can be compared to each other more conveniently.
Furthermore, height images can now also be captured with stereomicroscopes without a motorized focus system.
Ideal for comprehensive height measurements using stereomicroscopes: the Stereo DiscoveryV8 with dual phototube S, two microscope cameras, eg, AxioCam ICc1, the image analysis mini workstation, the AxioVision 4.7 basic package and the new version of the AxioVision topography module.
