Common faults in solar cells and panels can now be detected far more simply using two high-performance cameras from Andor Technology - the iKon-M 934 BR-DD and the LucaEM R.
Both cameras have high quantum detection efficiency and sensitivity in the near-infrared (NIR) range, making them suitable for solar cell quality control during manufacturing.
They harness the phenomenon of induced photovoltaic electroluminescence, where weak emissions in the 900-1100nm wavelength range are used to detect typical faults such as shunts, crystalline defects and broken-finger electrodes.
These cameras also offer high sensitivity at rapid frame rates, meaning they can be used for high-throughput testing of individual photovoltaic cells or larger panels.
By incorporating photovoltaic electroluminescence into their QC routines and RandD work, manufacturers can benefit from a simpler, potentially less expensive inspection technique.
However, as photovoltaic electroluminescence emissions are very weak, extremely sensitive cameras are required, such as the iKon-M BR-DD and the LucaEM R.
The LucaEM R is a highly cost-effective yet fast and powerful electron-multiplying CCD camera for high-throughput inline production inspection.
LucaEM R uses a monochrome megapixel frame-transfer EMCCD sensor, providing single- photon detection sensitivity and high NIR quantum efficiency (27 per cent at 900nm) in a cooled, compact, USB 2.0 camera platform.
The iKon-M 934 BRDD is designed to offer high responsivity in the NIR region, delivering around 70 per cent QE at 900nm.
The megapixel CCD camera also benefits from deep TE cooling to -100C, very low read noise and a USB 2.0 interface.
