Witec, a manufacturer of high-resolution optical and scanning probe microscopy solutions, has introduced a software package for advanced data evaluation and chemometric image processing.
The Witec Project Plus features various tools for multivariate data analysis in the fields of confocal Raman imaging and scanning probe microscopy, such as cluster analysis and principal component analysis.
Hidden structures in the images can be visualised automatically, leading to quick and consistent interpretation of the data, according to the company.
Additionally, a range of advanced patent-pending analysis tools and algorithms enable comprehensive computerised data evaluation and image generation.
It is claimed that the speed with which the extensive calculations behind the various algorithms and procedures can be executed provides a level of capability in analysis operations.
Witec Project Plus can be obtained as an add-on software package for the Witec Project data evaluation software.
Dr Joachim Koenen, managing director at Witec, said: 'With Witec Project Plus, we provide another software module for unparalleled and unmatched chemical, structural and optical imaging at the highest resolution.
'It ideally supports Witec's philosophy of delivering a single-software environment for a variety of microscopic techniques, measurement modes and microscope models,' he added.
In confocal Raman imaging, a complete Raman spectrum is acquired at each image pixel, resulting in images consisting of tens of thousands of spectra.
The Witec microscope series allows the combination of Raman imaging with atomic force microscopy for a more comprehensive investigation of a sample.
The Witec Project package provides a software environment from one source for the various microscopic techniques, measurement modes and microscope models.
