Shimadzu introduces the EDX-GP energy-dispersive X-ray fluorescence Spectrometer for RoHS/ELV Screening.
The EDX-GP offers fast, high-sensitivity measurements optimised for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users.
The EDX-GP uses the same proprietary semiconductor detector as Shimadzu's EDX-720 to deliver high-sensitivity, high-resolution and precision measurement of all light to heavy elements.
The optical system, special filters and high count-rate circuit deliver suitable performance for RoHS/ELV screening.
Optimal filters are automatically selected and high-speed mode conditions are installed by default to allow batch measurements of RoHS/ELV hazardous elements using a single filter.
Users can complete a single-filter, high-speed analysis in 30 seconds, or a high-sensitivity analysis with a special filter in 300 seconds.
With the EDX-GP, operations that previously relied on a user's judgment are automated, including instrument start-up and calibration, and the selection of analytical conditions.
The software also features a measurement time reduction function for high concentrations of hazardous elements and for samples containing no hazardous elements.
The EDX-GP has a large sample chamber to accommodate as-is measurements of any sample shape or size.
Users can load samples quickly and easily with a semiautomatic chamber door for high throughput with less workload.
Other standard functions include pre-measurement instrument check to determine if calibration is necessary; automatic material evaluation to pre-measure sample materials and select analytical conditions; shape correction to eliminate the effect of shape and thickness on results; and thin-film analysis for single- and multi-layer samples.
