Olympus discussed the importance of reliability in metrology while showcasing its latest developments at EUSPEN 2012.
At the recent European Society for Precision Engineering and Nanotechnology (EUSPEN) in Sweden, Olympus showcased its opto-digital microscope, the DSX500, along with the LEXT OLS4000 confocal laser scanning microscope (CLSM) with an updated software version.
The complete DSX series is comprised of three different models; the DSX100 free-angle wide zoom microscope, the DSX500 high resolution upright microscope and the DSX500i high resolution inverted microscope, meeting the needs of applications across R&D and quality control.
The latest updates to the LEXT OLS4000 CLSM microscope were also showcased at the meeting. These included:
- 64 bit compatibility
- A high speed high resolution mode
- A 3D multilayer function
- Improved clarity and resolution
- Steep slope detection up to 85º
Meanwhile, as part of the poster session, Dr Andre Felgner (PTB) presented ’How reliable are optical 3D measurements?’, stressing the importance of reliability in metrology and how it can be influenced by instrument characteristics and measurement conditions.
According to the company, this work further emphasises the importance of the development and implementation of good practice guidelines to comply with the upcoming ISO 25178-600 series of standards. The methods detailed allow users to obtain resolution close to that of a stylus method, without risking any damage to the sample surface.
