Time-of-flight mass spectrometry at Pittcon 2013

On show will be the company’s time-of-flight (TOF) mass spectrometer, BenchTOF-dx, which provides the analyst with the capability to capture reference-quality full spectral information at traditional SIM detection limits.

Combining selectivity, stability and speed with full spectral sensitivity, the instrument claims to deliver high-definition mass spectrometry and performance for every GC application.

It offers identification and measurement of both target compounds and unknowns in highly complex matrices and at the lowest possible levels.

Features include:

• Ion optics and direct-extraction technology maximise sensitivity
• Full scan data at quadrupole SIM sensitivity levels (>800:1 s/n for 1 pg OFN while scanning over full mass range)
• Enhanced detection of trace target analytes
• High speed spectral acquisition (10,000 Hz) for compatibility with fast GC, GCxGC (2D GC) and complex conventional GC profiles. 100 “scansets” written to disc every second
• Mass range of 1 to 1000 amu, with mass resolution of 1000, ensures compatibility with every GC application
• 0.01 amu spectral display for 12C/13C isotope resolution

Among the suite of products on display will also be a new version of TargetView, a software package for compound identification following GC/MS analysis.

Capable of detecting and identifying both targeted and unknown compounds in complex GC/MS chromatograms, for either trace-level work or for routine screening, the software has been designed for all GC/MS analysts irrespective of their field of work. 

TargetView delivers rapid screening of chromatograms against compound libraries, and provides the analyst with the capability to quickly and easily create bespoke spectral libraries.

In addition to this, a new batch-processing option now allows multiple files to be screened against a single library.

The company will be exhibiting on booth 4008 and 4009 at Pittcon in Philadelphia from March 17 - March 21, 2013.