The Extended Range, Dual-AR technology system is the latest from the company’s iKon-M imaging and spectroscopy series.
The system boasts a broad and high QE coverage from ultra-violet through to near infrared (NIR) across the single unit.
Available on the 1 Megapixel iKon-M 934 CCD platform, the Extended Range Dual-AR technology facilitates broadening of the QE range of back-illuminated, deep-depletion sensors through implementation of a new dual anti-reflection coating process on enhanced silicon.
Andor claims this technology builds upon the natural NIR of deep depletion sensors and has the ability to extend sensitivity into the visible and UV regions - with ~90% or greater QE in the 400-850 nm range.
Its built-in Fringe Suppression Technology is designed to ensure etaloning is minimised in the NIR region.
Colin Coates, imaging product manager at Andor Technology, commented: “The extended QE performance of the dual-AR deep depletion CCD, combined with the negligible etaloning, constitutes an attractive solution for long exposure broadband applications, such as astronomy and luminescence microscopy.”
Features overview:
- 100 °C UltraVac™ TE cooling.
- Up to 95% QE and extra-low noise floor.
- C-mount shutter as standard.
