Hiden Analytical has announced its latest range of surface and surface interface diagnostic tools.
Based on the UHV Secondary Ion Mass Spectrometry (SIMS) technique the tools are designed to provide high performance surface elemental and contamination analysis along with depth profiling with nanometer scale depth resolution.
Hiden surface diagnostics systems are designed to work well with sample types including metallurgical thin films, coatings, solar cells and semiconductors.
The systems also include high depth and spatial resolution, providing 3D images of the uppermost layers of surfaces and thin films on a nano/micron scale.
A wide range of sample sizes and shapes can be accommodated in the UHV sample load lock.
The Hiden SIMS analysis tool is a modular system starting at a foundation level.
The company claims it offers world class performance at an affordable price level combined with low cost of ownership.
Systems include a dedicated SIMS user interface for straightforward operation. Training for a new starter can typically be completed within 2 -3 days.
