Higher positional accuracy is ensured during scanning, and scanning is made faster since data acquisition now occurs during both directions of scanning
Following the successful adoption by a number of UK facilities of the MicroMesure system for 3D non-contact surface profiling, Armstrong Optical announces the introduction of the new MicroMesure II system that has new and upgraded functionality. The MicroMesure systems are produced by Stil - the first company to commercialise extended field confocal scanning optical microscopy for the analysis of surfaces.
In order to make the changeover from one sensor to another simple and automatic, an optional mechanical turret system is now available.
This allows up to four sensors, two cameras or complementary third-party sensors to be utilised during a profiling run without user interaction.
The addition of optical encoders on the X and Y scanning axes brings two advantages.
Higher positional accuracy is ensured during scanning, and scanning is made faster since data acquisition now occurs during both directions of scanning. The SurfaceMap system control software has also been upgraded to include a rapid prescan and automatic surface search functions - ensuring that surfaces are profiled under optimum conditions. Many other features now available on the MicroMesure II have been included to meet user requirements ensuring that the system provides the most cost-effective solution to a wide range of surface profiling needs.
