New Olympus BX41M-ESD microscope for materials microscopy allows safe examination of electrostatically sensitive samples
A special version of the new Olympus BX2M series of microscopes for materials microscopy has been introduced to allow the safe examination of electrostatically sensitive samples.
Many electronics components can be damaged by the build up of potential and subsequent sparking.
When studying such components under a microscope, it is therefore necessary to eliminate any possible electrostatic charge from the operator and from surrounding air.
By making all operational elements of the frame conductive, the new BX41M-ESD microscope simply eliminates any electrostatic build-up of charge.
Focus control, revolving nosepiece ring, brightness control and other parts safely conduct charge away.
In standard configuration, the BX41M-ESD provides exceptionally bright images with UIS optics for brightfield, darkfield, Nomarski DIC and polarised light observation.
A universal illuminator is also available to provide fluorescence capability.
Exceptionally long working distance objectives - 21mm for 20x, 15mm for 50x - are available for observation of unprepared samples.
Inserting a spacer makes it possible to observe samples over 65mm in height.
The microscopes are compatible with a wide range of Olympus digital and film photographic systems.
