A new system for infrared observation has been developed by Olympus for use with the BX51 metallurgical microscope
Near infrared light observations are a valuable method of studying semiconductor interiors and the back surface of a chip package, as well as CSP bump inspections.
For use with the BX51M materials microscope from Olympus, a selection of objectives has been specifically designed to compensate for optical aberrations from visible wavelengths right through to the NIR range.
Six objectives are available to cover the range from 5x to 100x magnification.
100W mercury illumination is provided.
Both a trinocular tube, and a single port tube with lens for direct video capture of IR images, are available.
In addition the system includes specialised band path and neutral density filters, polariser slider, and a rotatable analyser slider, all optimised for IR operation.
Adjustment of the microscope arm height allows samples over 65 mm in height to be placed on the stage and examined.
