Technique provides materials characterisation capabilities with the resolution needed to investigate nanostructured materials in order to understand and control their properties
Visitors to the Oxford Nanoscience stand at MicroScience 2004, 6-8 July, will have the opportunity to view some of the 3D atomic distribution maps recorded on the company's 3DAP (three dimensional atom probe) system.
This gives further examples of the application of the 3DAP technique which will be discussed by Professor Alfred Cerezo (University of Oxford) during the associated MicroScience conference.
3DAP provides the ultimate resolution for chemical analysis of materials, and is capable of reconstructing the distribution of individual atoms within a material with sub-nanometre resolution in all three dimensions. This gives both spatial and compositional information simultaneously.
The 3DAP atom probe technique provides materials characterisation capabilities with the resolution needed to investigate nanostructured materials in order to understand and control their properties.
Such materials range from advanced engineering alloys to device materials containing different layers of nanometre thickness.
The 3D visualisation software on show allows maps to be constructed from the particular elements of interest to allow spatial distributions to be viewed without possible interference.
3D distributions can be viewed from any angle and particular regions of interest in the sample can be examined in detail by creating slices and moving them through the image in any plane.
