Integrates a pulse pattern generator and error detector in a compact package to optimise the use of bench space and allows measurements to be carried out alongside the system or device being tested
The AP9945 from Yokogawa is a compact, portable bit-error-rate tester dedicated to high-speed measurements in the 10Gbit/s band.
The AP9945 integrates a pulse pattern generator and error detector in a compact, lightweight (5kg) package which optimises the use of bench space and allows measurements to be carried out alongside the system or device being tested.
The unit is designed to be used in conjunction with a Windows based PC via a USB connection, for which the driver and control software are provided as standard features.
A variable source option provides bit-rates from 9.95 to 11.32Gbit/s, covering all relevant standards including SDH/Sonet, 10G ethernet, fibre channel and OTN.
Output amplitude (0.5 to 2V peak to-peak), offset (-2 to +3V) and crosspoint (30% to 70%) can all be adjusted.
A clock and data recovery (CDR) function is included as a standard feature.
The CDR signal extracts the clock from the data signal and performs synchronisation when a data signal is the only input: a common scenario in optical communications.
In addition to the CDR input port, there are ports for inputting separate data and clock signals.
A trigger output is included for oscilloscope synchronisation, as well as a port for external 10Gbit/s clock synchronisation input and 1/16 or 1/64 synchronisation inputs.
Using this port, it is possible to perform an error-rate test with jitter deliberately added to the data pattern.
The AP9945 will generate two types of test patterns: pseudo-random (PRBS) patterns and programme patterns.
The PRBS patterns range from PRBS7 to PRBS31, while in the standard configuration, the AP9945 program pattern consists of 128 bytes.
In addition to signal generation in the 10Gbit/s band, the instrument can generate signals at divide rates of 1/2 (5Gbit/s band), 1/4 (2.5Gbit/s band) and 1/8 (1.25Gbit/s band).
