Animated web special takes the viewer through the applications and exceptional analytical capabilities of the confocal laser scanning microscope in a visually interesting and easy to follow format
Following the launch of the Lext confocal laser scanning microscope for ultra-precise surface analysis, Olympus is now running an on-line special feature on this new metrology system.
The animated web special takes the viewer through the applications and exceptional analytical capabilities of the Lext in a visually interesting and easy to follow format.
Viewers can experience the many unique features of the advanced new system which offers far higher resolution than conventional optical devices.
The web demonstration illustrates the real time 3D observation and acquisition of high precision measurements from samples placed directly onto the microscope stage with no prior preparation.
These advanced features are possible because the Lext combines advanced colour and laser scanning confocal microscopy techniques.
The web special also enables the viewer to evaluate numerous application images in 2D and 3D, from metal corrosion on automotive parts to the measurement of the laser mark depth for bare wafer manufacture.
Lext can profile objects that are normally difficult to scan using conventional methods, such as those with differing surface properties or slanted regions.
Its image processing features are explored in detail, including noise filtering, curve and tilt compensation and edge contrast and enhancement.
In addition, its analytical capabilities are demonstrated, including particle analysis and 2D, depth, volume/surface area, line width and geometrical measurements.
The web special also provides an animated explanation of the Lext's specially developed Mems-scanner (micro-electro mechanical system) which increases the speed and reproducibility of the scanning process compared to conventional technologies.
Olympus describes Lext as a new confocal laser scanning microscope for ultra-precise measurement and observation with the highest levels of reliability.
Both 3D observation and high-precision 3D measurement are possible in real time.
With outstanding 0.12um resolution and a magnification range from 120x to 14,400x, Lext is designed for researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEM).
Unlike SEM any sample can be placed directly on the Lext microscope stage without pre-treatment.
Lext is said to be ideally suited for ultra-fine surface observation and measurements required for micro fabrication of devices like Mems (micro electro mechanical system), for new materials development, and for today's thinner devices, with more compact surface mounting requirements.
