All Electron microscopy systems
Hitachi High-Technologies - latest company news
Hitachi High Technologies | Added: 8 Jun 2009
8 June 2009 - Hitachi High-Technologies is celebrating 50 years of supply of Hitachi electron micro…
Jeol JSM-7600F e-beam SEM advances nanoscience
Jeol USA | Added: 3 Jun 2009
West Virginia University has installed a Jeol JSM-7600F e-beam lithography/scanning electron micros…
Asylum announces Petri dish accessory
Asylum Research | Added: 18 May 2009
Asylum Research is introducing an enhanced Petri dish holder and heater accessory for its MFP-3D at…
Titan ETEM microscope ordered by Stanford
FEI | Added: 7 May 2009
FEI has announced that Stanford University has ordered the Titan 80-300 environmental transmission …
Asylum Research announces Coolerheater accessory
Asylum Research | Added: 1 May 2009
Asylum Research is introducing a Coolerheater accessory designed for polymer and other studies wher…
Protochips secures finance for Aduro system
Protochips | Added: 20 Apr 2009
Protochips has closed on its first round of equity financing to support the introduction of the Adu…
EMS offers Applied Physics LaB6 and CeB6 cathodes
Electron Microscopy Sciences | Added: 15 Apr 2009
Applied Physics Technologies (APTech) lanthanum hexaboride (LaB6) and cerium hexaboride (CeB6 or Ce…
Hitachi enhances TM-1000 electron microscope
Hitachi High Technologies | Added: 15 Apr 2009
Hitachi High-Technologies, in partnership with Deben, has enhanced the TM-1000 scanning electron mi…
Lambda releases personal electron microscope
Lambda Photometrics | Added: 9 Apr 2009
Lambda Photometrics's Phenom desktop SEM bridges the gap between optical and electron microscopy.
Fibermetric system analyses nano-fibres
FEI | Added: 3 Apr 2009
FEI has announced the Fibermetric system powered by the Phenom personal electron microscope.
Electron Microscopy announces staining workshop
Electron Microscopy Sciences | Added: 18 Mar 2009
Aurion and Electron Microscopy Sciences will hold their spring east coast workshop on Immuno Gold S…
Asylum Research offers AFM in Biology class
Asylum Research | Added: 17 Mar 2009
Asylum Research has announced its latest AFM in Biology class, to be held from 3-5 June 2009 in San…
Jeol unveils JEM-ARM200F microscope
Jeol USA | Added: 16 Mar 2009
Jeol has introduced the JEM-ARM200F atomic resolution analytical microscope.
FEI unveils Quanta 50 scanning electron microscope
FEI | Added: 16 Mar 2009
FEI has announced the Quanta 50 Series scanning electron microscope (SEM).
JEOL introduces sensitive GC-TOF mass spectrometer
Jeol USA | Added: 12 Mar 2009
The AccuTOF-GCv from JEOL features one of the highest sensitivities of any GC time-of-flight mass s…
Jeol to showcase new instrumentation at Pittcon
Jeol USA | Added: 11 Mar 2009
Jeol is celebrating its 60th anniversary by showcasing new microscopy and spectroscopy instrumentat…
Asylum extends standard warranty
Asylum Research | Added: 6 Mar 2009
Asylum Research has broadened its standard warranty coverage to two years for atomic force/scanning…
TEMs offer tomography systems
Jeol USA | Added: 9 Feb 2009
Jeol USA has launched tomography systems for transmission electron microscopy (TEM).
EMS launches catalogue in e-book format
Electron Microscopy Sciences | Added: 20 Jan 2009
Electron Microscopy Sciences (EMS) has announced that its 2008-2010 catalogue is now available in e…
Asylum Research's MFP Nanoindenter wins AVS award
Asylum Research | Added: 16 Jan 2009
AVS has selected Asylum Research's MFP-3D Nanoindenter as one of the top five products exhibited at…
