Brazil's National Institute of Metrology, Standardization and Industrial Quality - Inmetro - has selected FEI to supply a suite of tools that enable nanoscale materials research
The selected systems include FEI's ultra-high resolution Titan S/Tem, a Tecnai Tem and a Nova NanoLab 600 DualBeam tool.
These systems will be used by the institute and other Brazilian institutions at Inmetro's new nano-materials centre in Rio de Janeiro.
Founded in 1973 by the Brazilian government, Inmetro's charter is to provide metrology and quality standards in a broad range of areas including chemicals, acoustics, electronics, mechanical systems, and optics, among others.
The institute also provides accreditation to organizations involved in inspection, product performance and training.
"Each of these new systems will provide us with the necessary ability to measure and characterize nanomaterials accurately and with more data than ever before," said Humberto Brandi, director of scientific and industrial metrology of Inmetro.
"In combination they will be an invaluable set of tools to reveal 3D data down to the sub-Angstrom level".
"The ultra-high resolution, reliability and ease of use of FEI tools are enabling the world's leading institutes and companies to advance their work at the nanoscale," said Rob Fastenau, senior vice president and general manager of FEI's NanoResearch and Industry market division.
"We are very pleased to be working with Inmetro and look forward to a successful relationship with this important centre." FEI anticipates a portion of the order will be shipped in 2006 and the remainder in the first half of 2007.
The order was booked in the first quarter of 2006.
