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Latest Articles

Large Area Deprocessing on 1x & 2x node Devices with Dx and Helios PFIB

Electronics failure analysis applications from FEI

FEI | Added: 20 Nov 2014

FEI has released two application packages for its third-generation Helios NanoLab DualBeam systems,…

3-D electron microscopy

Metals lab to open at microscopy centre

FEI | Added: 9 Jun 2014

FEI and The University of Manchester have announced their collaboration on the Metals Lab at The Un…

The Tecnai Femto is the first system to commercialise patented ultrafast electron microscopy technol

Ultrafast electron microscope

FEI | Added: 14 Nov 2013

FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…

ExSolve is designed to offer an automated, high-throughput sample preparation workflow for transmiss

High-throughput microscopy sample preparation

FEI | Added: 13 Nov 2013

ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…

FEI launches three systems that tailor the power of TEMs to specific application and industry needs

FEI introduces three TEM systems

FEI | Added: 12 Aug 2013

FEI has launched three systems that tailor the power of transmission electron microscopy to specifi…

The Helios NanoLab 660 DualBeam system

FEI to showcase Helios NanoLab 660

FEI | Added: 4 Jul 2013

FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…

The Helios NanoLab 1200AT DualBeam system

FEI launches Helios 1200AT Dual Beam system

FEI | Added: 13 Jun 2013

The NanoLab 1200AT system claims to deliver results 3 times faster than lab analysis of cleaved waf…

The FEI Tecnai Arctica TEM

FEI launches Tecnai Arctica for structural analysis

FEI | Added: 12 Feb 2013

Tecnai Arctica makes advanced structural analysis available to a broader range of facilities and bu…

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A correlative microscopy solution for cell biologists

FEI | Added: 27 Nov 2012

New methods in correlative microscopy are helping combine data from different imaging techniques.


FEI launches Helios NanoLab 450 F1 DualBeam

FEI | Added: 13 Nov 2012

The DualBeam from FEI claims to deliver faster, more accurate answers for new processes and materia…


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