FEI
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Hillsboro
Oregon
97124
Latest Articles
![Large Area Deprocessing on 1x & 2x node Devices with Dx and Helios PFIB](/files/img_cache/80_80_1Large_Area_Deprocessing_on_1x_%26_2x_node_Devices_with_Dx_and_Helios_PFIB.jpg?1463370850)
Electronics failure analysis applications from FEI
FEI | Added: 20 Nov 2014
FEI has released two application packages for its third-generation Helios NanoLab DualBeam systems,…
Metals lab to open at microscopy centre
FEI | Added: 9 Jun 2014
FEI and The University of Manchester have announced their collaboration on the Metals Lab at The Un…
![The Tecnai Femto is the first system to commercialise patented ultrafast electron microscopy technol](/files/img_cache/80_80_1Tecnai_Femto.jpg?1456223419)
Ultrafast electron microscope
FEI | Added: 14 Nov 2013
FEI has launched the Tecnai Femto ultrafast electron microscope (UEM), enabling scientists to explo…
![ExSolve is designed to offer an automated, high-throughput sample preparation workflow for transmiss](/files/img_cache/80_80_1ExSolve_WTP_Right_final.jpg?1463370850)
High-throughput microscopy sample preparation
FEI | Added: 13 Nov 2013
ExSolve wafer TEM prep from FEI enables semiconductor and data storage manufacturers to obtain more…
![FEI launches three systems that tailor the power of TEMs to specific application and industry needs](/files/img_cache/80_80_1TEM_reveal.jpg?1463370850)
FEI introduces three TEM systems
FEI | Added: 12 Aug 2013
FEI has launched three systems that tailor the power of transmission electron microscopy to specifi…
![The Helios NanoLab 660 DualBeam system](/files/img_cache/80_80_1FEI-HeliosNanoLab-660.jpg?1456223399)
FEI to showcase Helios NanoLab 660
FEI | Added: 4 Jul 2013
FEI’s DualBeam system is being showcased at the 7th International Conference on Materials for Advan…
![The Helios NanoLab 1200AT DualBeam system](/files/img_cache/80_80_1Helios-NanoLab-1200AT_AFL_no_table_%281%29.jpg?1463370850)
FEI launches Helios 1200AT Dual Beam system
FEI | Added: 13 Jun 2013
The NanoLab 1200AT system claims to deliver results 3 times faster than lab analysis of cleaved waf…
![The FEI Tecnai Arctica TEM](/files/img_cache/80_80_1FEI_Tecnai_Arctica.jpg?1463370850)
FEI launches Tecnai Arctica for structural analysis
FEI | Added: 12 Feb 2013
Tecnai Arctica makes advanced structural analysis available to a broader range of facilities and bu…
![image 1](/files/img_cache/80_80_1tecnai-G2-TF12_iCorr.jpg?1456223415)
A correlative microscopy solution for cell biologists
FEI | Added: 27 Nov 2012
New methods in correlative microscopy are helping combine data from different imaging techniques.
![Helios](/files/img_cache/80_80_1Helios_NanoLab_450_F1_DualBeam.jpg?1463370850)
FEI launches Helios NanoLab 450 F1 DualBeam
FEI | Added: 13 Nov 2012
The DualBeam from FEI claims to deliver faster, more accurate answers for new processes and materia…