Designed to boost laser diffraction particle size analysis to the next level, with its enhanced PIDS technology and extended measurement range, the LS 13 320 XR Particle Size Analyser from Beckman Coulter is now available in the UK from Meritics.
The analyser’s expanded dynamic measurement range provides real (not extrapolated), analytical data down to 10 nm, and high-resolution measurements up to 3,500 μm. With advanced auto-modality, no knowledge about particle size distribution (e.g., multiple fractions, narrow distribution) is needed prior to measurement in order to obtain a correct result.
It also features Enhanced Polarisation Intensity Differential Scattering (PIDS) technology to enable more precise raw data detection and increased detector sensitivity of vertical and horizontal polarised scattered light for sub-μm particle size analysis—a measurement quality previously unavailable. The intensity vs. scattering angle information from PIDS signals is incorporated into the standard algorithm from the intensity vs. scattering angle data from laser light scattering to give a continuous size distribution. Another major benefit of PIDS data is that simple interpretation of raw data can quickly confirm if small particles are actually present, as large particles don’t exhibit the differential signal shown by small particles.
Easy-to-use software helps compress workflows, expedite method creation, and simplify daily operation. It is also possible to customise SOM creation by defining module settings, sample properties (including definition of the sampled material) and the carrier fluid. After a method is saved, it can be used 24/7 for all measurements without creating a new method.
The LS 13 320 XR is suitable for easy, fast and accurate analysis of suspensions, emulsions and dry powders used in or manufactured by a variety of industries, including: Biopharma, Food & Beverage, Chemicals & Materials, Abrasives, Cement, Cosmetics, Toner & Ink and Nanotechnology.