Bruker AXS, in cooperation with the the Microbeam Analysis Society, announces the creation of the Duncumb Award for Excellence in Microanalysis; first winner is David Williams of Lehigh University
The Duncumb Award for Excellence in Microanalysis will be presented to a person that has made significant contributions over their career to the field of microanalysis, in the advancement of the science and practice as well as in education and service to the microanalysis community.
The award, sponsored by Bruker AXS Microanalysis, includes a plaque and US$2000, and will be presented annually at the MAS Presidential Happenings at the Microscopy and Microanalysis meeting.
It honours the seminal contributions to the field of microanalysis made by Peter Duncumb.
Duncumb developed X-ray mapping more than 50 years ago and was also instrumental in the development of analytical electron microscopy.
Nominations are solicited from the entire microanalysis community to the MAS president.
The MAS awards committee, consisting of the MAS president and the two incoming directors, will then make the final decision.
Nominations are due by 1 January of the year of the award.
This year the inaugural Duncumb Award for Excellence in Microanalysis will go to Professor David Williams of Lehigh University.
Williams has been a leader in microanalysis for many years, in particular in the area of analytical electron microanalysis and microscopy.
He has also been instrumental in the training of almost 5000 students, technologists, engineers and scientists at the Lehigh Microscopy School.
The worldwide microanalysis community is a richer place today due to Williams's contributions, says Bruker.
