Jeol is celebrating its 60th anniversary by showcasing new microscopy and spectroscopy instrumentation at Pittcon 2009 on 8-13 March in Chicago.
The company will also spotlight its advances in NMR.
Additionally, Jeol will present new topics on NMR and TEM during the invited symposia, 'The State-of-the-Art Technologies from Japan I and II', held during the Pittcon 2009 Symposium week on 10 March.
At Pittcon 2009, Jeol will introduce an atomic resolution analytical microscope.
A new family of scanning electron microscopes (SEM) includes a new thermal field emission SEM that combines high-speed analysis with ultra-high-resolution imaging at 1,000,000X magnification.
The imaging capability of the SEM is now available in a benchtop model.
