Jeol USA
11 Dearborn Road
Peabody, Massachusetts
01960
Latest Articles
High-throughput SEM from JEOL
Jeol USA | Added: 26 Nov 2015
JEOL’s JSM-IT100 is the latest addition to its InTouchScope series of Scanning Electron Microscopes…
Explosive trace detection with mass spectrometer
Jeol USA | Added: 5 Mar 2015
The JEOL AccuTOF-DART time-of-flight mass spectrometer is part of a new method which enables traces…
JEOL unveils JEM-1400Plus
Jeol USA | Added: 21 Aug 2013
Jeol demonstrated its JEM-1400Plus at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indian…
JEOL partnership in two-dimensional gas chromatography
Jeol USA | Added: 18 Jun 2013
The Zoex two-dimensional gas chromatography with its ccuTOF GCV 4G high-resolution time-of-flight m…
JEOL Resonance introduces zero boil off magnet
Jeol USA | Added: 19 Apr 2013
JEOL Resonance has developed NMR magnet that operates on a minimum amount of liquid helium.
Scanning Electron Microscopy applied to porous materials
Jeol USA | Added: 31 Oct 2012
This document provides an appraisal of high resolution Scanning Electron Microscopy applied to poro…
GC-TOF increases data acquisition speed
Jeol USA | Added: 13 Aug 2012
The AccuTOF GCv model claims to offer faster data acquisition rates and higher resolving power than…
NeoScope microscope delivers improved magnification
Jeol USA | Added: 12 Jul 2012
Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.
Ultra-high resolution analytical field emission SEM
Jeol USA | Added: 5 Jun 2012
High performance FE-SEM optimised for sub-nm resolution imaging of any type of sample
Fastest and smallest ever solid state NMR probe
Jeol USA | Added: 20 Apr 2012
JEOL Resonance, headquartered in Akishima, Tokyo, has announced a new 0.75 mm solid state NMR probe.
