Pittcon 2009, taking place from 8-13 March in Chicago, will see the launch of Panalytical's standardless analysis package, Omnian.
This latest module in the company's SuperQ software suite is designed to be used with the Axios sequential X-ray fluorescence (XRF) spectrometer.
Omnian is suitable for characterisation and analysis of unknown samples, or in situations where certified standards that match specific sample characteristics are not available.
Omnian can handle a wide variety of sample types such as solids, pressed powders, fused beads, loose powders and liquids.
The software is adaptable, depending on user experience or the desired mode of operation.
It deals with sample quantification, screening and failure analysis, as well as the comparison of different materials.
It is designed to provide fast, reliable quantification in the default 'black box' mode.
However, the data collected is comprehensive and can be reviewed more extensively.
The system adjusts automatically to sample and matrix effects as well as sample thickness, volume and 'dark-matrix' composition.
It can be fine-tuned for increased accuracy by using adaptive sample characterisation (ASC).
Omnian is supported by Panalytical's worldwide network of support and service specialists.
