Panalytical will showcase the Axios range of XRF spectrometers, as well as other products, at this year's Achema conference and exhibition, to be held 11 - 15 May 2009 in Frankfurt.
The instrumentation, software and standards packages will demonstrate complete solutions for elemental analysis in the cement, mining, metals, pharmaceutical, chemical, plastics and oil industries.
Among the products on display will be the Omnian XRF-analysis package, which quantifies unknown samples.
Visitors will be able to test Panalytical's Prefix system for rapidly exchanging optical components, without the need for realignment.
Panalytical's X'Pert Pro system allows an unmatched range of geometries, from the traditional Bragg-Brentano to an ultra-fast transmission high-throughput system with the PIXcel detector.
It can also accommodate a Saxs setup.
Panalytical will also present a range of XRD hardware and software.
Flexible XRD software covers phase analysis, stress and thin-film analysis, high-end cluster analysis and small-angle scattering.
Panalytical experts will be on hand to discuss specific application challenges.
