The atomic-resolution Jeol JEM-ARM200F transmission electron microscope (TEM) has been purchased by the University of Texas San Antonio.
'Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this instrument and the skill of the UTSA-Jeol team to quickly power up the first TEM of its kind,' said Dr Thomas Isabell, Jeol director of the TEM Product Division.
The JEM-ARM200F enables atom-by-atom imaging resolution and spatial resolution for atom-to-atom chemical mapping of materials, including energy-dispersive X-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS).
The new electron-column design integrates S/TEM with Cs correction for atomic spatial energy resolution, combined with high probe currents for microanalysis.
