Jeol USA and the University of Texas at Dallas (UTD) have announced the university's acquisition of the Jeol atomic resolution transmission electron microscope (TEM).
The ARM200F is an aberration-corrected TEM that is claimed to achieve better than one Angstrom resolution in STEM, TEM and chemical analysis at the atomic level.
Using the ARM200F TEM, UTD will advance its role as contributor to the development of next-generation semiconductor devices and as a resource for local industry research and that of several technical consortiums.
UTD is a hub for two semiconductor research consortiums, infusing the area with business opportunities: the Texas Fusion (Future Semiconductor Commercialization) consortium, financed by the South Korean government and the Texas Emerging Technology Fund; and the Silicon Wafer Engineering and Defect Science Industry/University Cooperative Research Center, an independent centre supported by the university and corporate members.
UTD is also a part of the Southwest Academy of Nanoelectronics, a nationally funded research center.
The Nano and Beyond lab at UTD has a staff of 14 and has two field emission Jeol TEMs.
Using the capabilities of the TEM for nanotechnology research will offer insights into atomic structures of device materials, allowing researchers to develop smaller and more efficient semiconductor chips, and explore novel nanomaterials for semiconductor devices.
UTD anticipates that the availability of next-generation electron microscope technology will also be a major draw for materials researchers as well as fledgling tech firms producing peripheral imaging equipment.
