Panalytical has introduced the Empyrean high-performance diffractometer for multipurpose X-ray diffraction (XRD), suitable for measuring powders, thin films, nanomaterials and 3D objects.
Empyrean features a range of new elements, including an X-ray source, a goniometer, sample stages and a radiation enclosure.
The instrument also includes a 3D detection system called Pixcel3D.
Users can switch between application setups in a fast and cost-effective way using the company's Prefix modules.
Dedicated hardware and software incorporated in predefined programs, along with a customisable desktop and batch sample capabilities, help make advanced functions accessible to everyone, according to Panalytical.
For many users, powder samples are their primary interest; for this, Empyrean is claimed to deliver high accuracy and data quality in a flexible and advanced system.
For thin films, meanwhile, Empyrean provides for high-resolution epitaxy analysis and handles all common applications.
Investigations into nanomaterials can also be performed with Empyrean; the size and shape of crystalline domains within the material and structural analysis of near-amorphous materials are all possible.
Pair distribution function (PDF), small-angle X-ray scattering (SAXS) and the ability to monitor the evolution of crystalline phases in situ with the slurry flow cell stage are all possible on the Empyrean platform.
Finally, the internal structure of solid objects can be studied without having to be cut: the Pixcel3D detector can be used as a computed-tomography scanner, enabling the non-destructive analysis of pharmaceutical formulations (tablets and capsules), electronic components (batteries, ICs and capacitors) and geo and archaeological samples.
