The Spectro Midex is a highly sensitive XRF spectrometer that has been developed for the analysis of tiny details in samples and for the elemental mapping of larger objects.
Typical applications are the identification of toxic elements in electronic devices (RoHS), the identification of inclusions, the analysis of jewellery and forensic analysis.
The Spectro Midex uses a small X-ray beam to irradiate the sample, which can be collimated down to a minimum spot size of 200um.
This is combined with a Silicon Drift Detector (SDD) and a measuring system more than twice as fast as conventional technology.
Proprietary FP+ calibration software permits accurate standardless analysis, even of unknown samples.
A complete analysis for elements from magnesium to uranium can be carried out in the range on a given point on an unknown sample in less than a few minutes.
For sample scanning and mapping, the large chamber can be fitted with a precision sample stage that can traverse large samples over a maximum distance of 240 x 178 x 160mm in the X,Y and Z axes, respectively.
The stage can handle samples up to 3kg in weight.
An integrated video system, combined with a laser spot marker, allows precise sample positioning.
The standard working distance from the sample is 2mm, but the long-distance version of the Midex has a 20mm working distance from the sample, which allows the examination of irregularly shaped samples - such as analysing the 'valleys' between components on a printed circuit board.
Software controlled, the XYZ sample stage can also be used as a sample changer for the analysis of large numbers of small samples.
The measurement area can be flushed with Helium to achieve maximum sensitivity for the 'light' elements from Mg to Cl.
This is less likely to damage or otherwise influence samples than a vacuum system and also means that damp samples may be analysed without drying.
Helium consumption is less than 100l/hr.
