Electron optical equipment and instrumentation provider Jeol USA has launched a cold field-emission gun for the atomic-resolution analytical JEM-ARM200F transmission electron microscope (TEM).
The ARM200F features advanced aberration-corrected S/TEM technology with high resolution.
Outfitted with the optional and field-retrofittable cold field-emission gun (FEG), the ARM200F's ultra-high imaging resolution is guaranteed at 78 picometres with an energy resolution of 0.3eV.
The higher brightness and smaller source size of the cold FEG produce a smaller, sharper electron probe with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis.
Additionally, the narrow energy spread of the electrons emitted from the cold FEG enables atomic-resolution analysis of EELS fine structures, which can be used to determine such things as electronic properties.
Ultra-high vacuum near the electron source is said to assure high stability of the electron probe current while high electrical system stability of 10-7 maintains the very narrow energy spread of the electron probe.
Dr Thomas Isabell, director of the TEM product division at Jeol USA, said: 'The addition of a cold FEG to the ARM family adds another arrow to the Jeol quiver for atomic-scale imaging and characterisation.
'This enhancement makes it possible to perform sub-Angstrom imaging and atomic column chemistry with accuracy, speed and ease,' he added.
The Jeol ARM200F electron column integrates the cold FEG, S/TEM and Cs correction in an ultra-stable design.
Superior shielding safeguards the ultra-high-powered optics from airflow, vibration, acoustical, magnetic, electronic, and thermal interferences.
The first ARM200F with cold FEG in the US will be installed at Florida State University's Applied Superconductivity Center, housed in the National High Magnetic Field Laboratory.
