Nanolane has launched the Sarfus 3D-IMM for the topographic characterisation of nanometric samples in water.
Sarfus 3D-IMM is designed to match the needs of the engineering and research community, especially in the life science, thin film and surface treatment areas.
It is dedicated to the observation of nano-objects in real time and to the thickness measurements of ultra-thin films in water.
Like the other Sarfus products, Sarfus 3D-IMM is based on SEEC optical technique that uses specific nonreflecting surfaces for cross-polarised reflected light microscopy.
These surfaces - the Surfs - are used instead of standard microscope slides and generate a contrast enhancement of about two orders of magnitude, extending the application fields of optical microscopy towards the nanoworld.
Thanks to the absence of scanning and its easiness of use, Sarfus 3D-IMM equipment opens new perspectives for nano-characterisation in aqueous media by allowing dynamic studies of nanometric structures and rapid quality control of samples.
In addition, the equipment is proposed with a powerful 3D topographic software for complete characterisation (layer thicknesses, section profiles and roughnesses) of nanometric samples.
