The National Institute of Standards and Technology (NIST) has ordered an analytical transmission electron microscope (TEM) from Jeol for its precision measurement laboratory in Colorado.
The purchase of the atomic-resolution JEM-ARM200F system was funded by the American Recovery and Reinvestment Act.
The JEM-ARM200F TEM, introduced in 2009, is ideal for advanced aberration-corrected S/TEM technology with 78pm resolution.
The instrument was designed from the ground up to integrate aberration correction into a shielded electron column that safeguards the high-powered optics from environmental interferences.
