Jeol introduces the Intouchscope, an analytical, low-vacuum scanning electron microscope (SEM) with integrated energy dispersive spectroscopy (EDS) and silicon drift detector (SDD) technology.
The Intouchscope features a multi-touch screen interface.
The user can expand windows and images with the sweep of two fingers, dial-in magnification and focus with a swipe, as well as select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.
The Intouchscope functions include: automatic SEM condition setup based on sample type; simultaneous multiple live image and movie capture; easy sample navigation at 5x to 300,000x magnifications; quantitative and qualitative elemental analysis; low- and high-vacuum operation; and wireless capability.
The Intouchscope has all the capabilities of a full-size tungsten SEM with integrated EDS analysis in a small, ergonomic design.
This portable, self-contained SEM also features an onboard turbo pump.
