Agar Scientific has introduced the 1060 SEM Mill from Fischione Instruments, designed to provide tabletop precision preparation for producing SEM samples for bulk milling, slope cutting and more.
The 1060 SEM Mill from Fischione creates the sample surface characteristics needed for SEM imaging and analysis.
It incorporates two independently adjustable TrueFocus (patent pending) ion sources, automatic gas control and an oil-free vacuum system for ultra-clean processing.
The system accommodates a wide range of sample sizes and configurations for applications such as bulk milling, electron backscatter diffraction (EBSD) and semiconductor preparation, together with traditional slope cutting and cross sectional polishing.
Rapid sample exchange is achieved through a vacuum load lock, which is evacuated within a few seconds once the sample is placed onto the stage.
Before milling, an automatic height sensing system provides feedback to a mechanical elevator so that the sample's top surface is properly aligned with respect to the ion beams.
Tilt angles are continuously adjustable in the range from 0deg to 10deg.
In addition to full sample rotation, the programmable rocking angle control is suitable for preparing cross-section samples.
Ion milling is used in the physical sciences to enhance the quality of the sample surface.
Inert gas, typically argon, is ionised and then accelerated toward the sample.
Two TrueFocus ion sources direct controlled-diameter ion beams to the sample regardless of energy.
The unique design of the TrueFocus ion source allows adjustable beam diameters.
When operated in the upper energy range (up to 6keV), milling is rapid, even at low angles.
When operated at low energy (as low as 100eV), material is gradually sputtered from the sample without inducing artefacts.
The 1060 is modular in design, allowing for basic instrument operation or fully automated control.
Users requiring only primary level instrumentation function will be satisfied with the basic version, while the premium version adds full computer control for setting, operating and recording a broad variety of instrument parameters.
Ion milling is automatically terminated at the end of the programmed time.
The microscope's long working distance allows the sample to be observed in situ while milling and a stereo microscope is available as an addition, to enhance sample viewing.
It can also be configured with an imaging system, including a high-magnification microscope coupled to a CCD camera and video monitor, to capture and display images.
