CANMET Materials Technology Laboratory (CANMET-MTL), a research centre funded by the Canadian government, has selected three FEI electron microscope systems for its new facility in Ontario.
As part of a competitive evaluation, the Canada Centre for Mineral and Energy Technology (CANMET) MTL has purchased the Tecnai Osiris scanning/transmission electron microscope (S/TEM), the Helios NanoLab DualBeam, and the Nova NanoSEM ultra-high resolution scanning electron microscope (SEM) for use at its government-funded facility in McMaster Innovation Park, Hamilton, Ontario.
According to Tony Edwards, senior vice president for FEI market divisions, the FEI systems were selected due to a combination of technical capability, price and superior service.
The Tecnai Osiris S/TEM combines good analytical throughput with ease-of-use for high-volume, multi-user research facilities.
It features FEI's ChemiSTEM technology, which reduces the time for large field-of-view elemental mapping from hours to minutes.
The powerful and versatile Helios NanoLab DualBeam integrates FEI's extreme high-resolution scanning electron microscope (XHR SEM) with a new high-performance Focused Ion Beam (FIB), to deliver imaging and milling capability.
It is designed for research centres that need to perform advanced material characterisation and modification down to the single nanometre scale.
FEI's Nova NanoSEM is an ultra-high resolution SEM designed to provide industry-leading nanometre-scale resolution and ultra-precise analysis on the widest range of samples.
Adding to this versatility, the system can examine highly insulating samples in low vacuum, with up to nearly the same resolution that can be achieved in high vacuum and with little or no preparation, eliminating artefacts and saving time.
The systems will be shipped to CANMET-MTL in Q1 2011.
