Malvern Instruments is to run two one-day short courses focused on particle and molecular characterisation at Pittcon 2011 on 13-18 March in Atlanta, GA, US.
The first of these on 14 March covers the fundamentals of particle sizing with an emphasis on light scattering techniques, while the second, taking place on 16 March, will examine molecular and particle characterisation by dynamic light scattering and zeta potential.
Registration is open for both via the Pittcon website.
'Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques' will bring newcomers to the particle-sizing field up to speed on the basics of particle size analysis.
The main techniques (sieves, sedimentation, electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.
'Molecular and Particle Characterisation by Dynamic Light Scattering and Zeta Potential' will discuss, review and provide tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.
