The two primary Hiden Analytical UHV ion guns for SIMS/SNMS applications - the IG5C and the IG20 - now feature the new Windows PC-based Labview program and control interface.
Together, these provide the fully integrated control of all ion-source, beam-steering and internally generated raster scan parameters and enable the store and recall of multiple profiling, imaging and sputter-cleaning formats.
The on-screen virtual interface panel gives instant access to all of the relevant parameters, with speedy adjustment ensured by the simulated rotary dial.
The IG20 ion gun addresses the analysis of electro-positive species and is an electron impact gas source system for operation with both oxygen and inert gases, with a beam diameter of just 50 microns.
The IG5C system with a caesium surface ionisation source is conceived for the measurement of electronegative species and features a low-power thermal-contact ion source with a beam diameter down to only 20 microns.
Ion gun setup is straightforward and stable operation is ensured for both the researcher and for routine day-to-day sample analysis.
Both guns operate with ion beam energies to 5kV and are configured with integral differential pumping to maintain true UHV integrity throughout the analyses.
