Jeol has developed Centurio, an energy dispersive spectrometer (EDS) for ultra-fast and ultra-sensitive collection of X-rays through analysis with its scanning transmission electron microscopes.
Centurio is a silicon drift detector EDS that collects X-rays from samples at a large solid angle of up to 0.98 steradians from a detection area of 100mm2.
The larger the solid angle of the measurement, the more data the EDS collects to construct detailed analytical maps of the elements in the sample.
With the ability to collect X-rays at high count rates, Centurio is said to speed elemental mapping and improves element detection sensitivity without loss of energy resolution.
Large pixel number EDS maps can be made at rates 10 times faster than with previous EDS designs with good signal-to-noise ratio.
Combined with the large probe currents in small probe sizes attainable with aberration-corrected scanning transmission electron microscopes, fast, efficient atomic-resolution EDS analysis is possible.
The automatically retractable side-entry design allows fast repositioning to avoid irradiation from back-scattered electrons.
Centurio expands the elemental mapping capability for the Jeol 200kV and higher transmission electron microscopes (TEMs), including the JEM-ARM200F atomic resolution TEM with optional cold field emission gun, and the JEM-2800 automated, high throughput, nano-area analysis TEM.
