Phenom-World has launched its all-in-one imaging and analysis system, the Phenom proX.
The device has been designed to eliminate switching between software packages or computers.
An EDS-detector is embedded in the Phenom proX system and does not require any additional cabling.
Emile Asselbergs, CEO at Phenom-World said: "We are giving our customers access to analysis with exactly the same ease of use they are used to with imaging mode".
Viewing three dimensional images of microscopic areas only solves half the problem in an analysis.
It is often necessary to identify the different elements associated with a specimen.
EDS is an analytical technique which can analyse X-rays that are generated by the specimen when bombarded by the Phenom CeB6 electron beam to identify the elemental composition of the specimen.
SEM imaging of a sample from production can reveal contamination with an unknown substance or the inclusion of unknown particles.
With the Phenom integrated X-ray analysis, these particles can be examined and their composition and potential origin revealed.
X-ray analysis is also important when monitoring a production process that needs to create a consistent material mix or specific consistence of materials, such as the fabrication of alloys and ceramics.
