McBain Systems, a provider of microscopes and inspection equipment, has introduced a more affordable system for infrared (IR) inspection in advanced technology industries
The new BT-IR Benchtop Infrared Microscope System allows an operator to see through materials that are transparent in the infrared range between 740nm and 1700nm.
Despite its lower price point, the company claims the new BT-IR provides exceptional precision.
Initial experiments indicate that it is able to penetrate thicker, more highly doped materials with rougher surfaces than other systems - and deliver higher quality images.
The BT-IR yields submicron-precision optical measurements, and its staging provides up to 0.1 micron linear encoder resolution.
In addition, the system is thought to have the highest resolution 900-1700 InGaAs digital camera in its class.
"The new BT-IR System fills an important market niche," said Michael Crump, President and CEO of McBain Systems.
"It is a manual system with a smaller footprint and lower price, yet it is designed to provide much of the power and flexibility of our higher end inspection systems".
The McBain BT-IR system features a motorised XY stage with joystick controls to navigate, observe and measure bonded wafer/die alignments, find defects in a manual mode and determine material stress via the system's optional birefringence capability.
The system is suited for imaging, verification, inspection and metrology for a range of QA/Reliability and R+D applications.
Typical in-process applications include verification of pre-bond and pre-hybridisation for critical-alignment applications.
Post-process uses include validation, inspection, and measurement of critical sub-surface features in NIR/SWIR-transmissible materials.
