Jeol has unveiled the latest NeoScope Scanning Electron Microscope (SEM) with improved design.
The NeoScope is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X.
Features include:
- Both high and low vacuum operation
- Three selectable accelerating voltages
- Secondary electron and backscattered electron imaging
- A touch screen interface
The NeoScope accommodates samples up to 70mm in diameter and 50mm in thickness. Both conductive and non-conductive samples can be examined. Optional EDS is available for elemental analysis.
