Agar has improved atomic force microscopy standards with Geller NIST and NPL-traceable calibration samples.
For atomic force microscopy (AFM) users, the Geller reference standards MRS-3, 4 and 5 are a series of high quality standards that are NIST/NPL traceable.
They allow the accurate calibration of scanning probe instruments such as STM and AFM.
These certified reference materials are generated using the magnification calibration procedures for optical, video and scanning microscopies.
Features overview:
- Accurate calibration of scanning probe instruments
- Magnification range is from ~10X to 1,000,000X
- The MRS-5 has pitch patterns from 2 ?m to 80 nm
